ONLINE TEST SERIES PORTAL

Tests | Test Activation Date | Test Closing Date | Test Type | Test Syllabus | No. of Ques. | Marks | Timing | Negative Marks |
---|---|---|---|---|---|---|---|---|

1 | 1 - July - 2017 | 11 - Feb - 2018 | Basic Level Test - 1 : Part Syllabus | Networks | 33 | 50 | 90 min | 1/3 Marks |

2 | Basic Level Test - 2 : Part Syllabus | Control Systems | 33 | 50 | 90 min | 1/3 Marks | ||

3 | Basic Level Test - 3 : Part Syllabus | Electronic Devices | 33 | 50 | 90 min | 1/3 Marks | ||

4 | Basic Level Test - 4 : Part Syllabus | Engineering Mathematics | 33 | 50 | 90 min | 1/3 Marks | ||

5 | Basic Level Test - 5 : Part Syllabus | Electromagnetics | 33 | 50 | 90 min | 1/3 Marks | ||

6 | Basic Level Test - 6 : Part Syllabus | General Aptitude | 33 | 50 | 90 min | 1/3 Marks | ||

7 | Basic Level Test - 7 : Part Syllabus | Signals & Systems | 33 | 50 | 90 min | 1/3 Marks | ||

8 | Basic Level Test - 8 : Part Syllabus | Analog Communication Systems | 33 | 50 | 90 min | 1/3 Marks | ||

9 | Basic Level Test - 9 : Part Syllabus | Digital Communication Systems | 33 | 50 | 90 min | 1/3 Marks | ||

10 | Basic Level Test - 10 : Part Syllabus | Digital Electronics | 33 | 50 | 90 min | 1/3 Marks | ||

11 | Basic Level Test - 11: Part Syllabus | Analog Electronics | 33 | 50 | 90 min | 1/3 Marks | ||

12 | Basic Level Test - 12: Part Syllabus | Microprocessors | 33 | 50 | 90 min | 1/3 Marks | ||

13 | 1 - Aug - 2017 | 11 - Feb - 2018 | Basic Level Test - 13: Full Syllabus | Full Syllabus Test-1 | 65 | 100 | 180 min | 1/3 Marks |

14 | Basic Level Test - 14: Full Syllabus | Full Syllabus Test-2 | 65 | 100 | 180 min | 1/3 Marks | ||

15 | Basic Level Test - 15: Full Syllabus | Full Syllabus Test-3 | 65 | 100 | 180 min | 1/3 Marks | ||

16 | Basic Level Test - 16: Full Syllabus | Full Syllabus Test-4 | 65 | 100 | 180 min | 1/3 Marks | ||

17 | 1- Sep - 2017 | 11 - Feb - 2018 | Advance Level Test - 1 : Part Syllabus | Networks | 33 | 50 | 90 min | 1/3 Marks |

18 | Advance Level Test - 2 : Part Syllabus | Control Systems | 33 | 50 | 90 min | 1/3 Marks | ||

19 | Advance Level Test - 3 : Part Syllabus | Electronic Devices | 33 | 50 | 90 min | 1/3 Marks | ||

20 | Advance Level Test - 4 : Part Syllabus | Engineering Mathematics | 33 | 50 | 90 min | 1/3 Marks | ||

21 | Advance Level Test - 5 : Part Syllabus | Electromagnetics | 33 | 50 | 90 min | 1/3 Marks | ||

22 | Advance Level Test - 6 : Part Syllabus | General Aptitude | 33 | 50 | 90 min | 1/3 Marks | ||

23 | 1- Oct - 2017 | 11 - Feb - 2018 | Advance Level Test - 7 : Part Syllabus | Signals & Systems | 33 | 50 | 90 min | 1/3 Marks |

24 | Advance Level Test - 8 : Part Syllabus | Analog Communication Systems | 33 | 50 | 90 min | 1/3 Marks | ||

25 | Advance Level Test - 9 : Part Syllabus | Digital Communication Systems | 33 | 50 | 90 min | 1/3 Marks | ||

26 | Advance Level Test - 10 : Part Syllabus | Digital Electronics | 33 | 50 | 90 min | 1/3 Marks | ||

27 | Advance Level Test - 11: Part Syllabus | Analog Electronics | 33 | 50 | 90 min | 1/3 Marks | ||

28 | Advance Level Test - 12: Part Syllabus | Microprocessors | 33 | 50 | 90 min | 1/3 Marks | ||

29 | 1- Nov - 2017 | 11 - Feb - 2018 | Advance Level Test - 13: Full Syllabus | Full Syllabus Test-1 | 65 | 100 | 180 min | 1/3 Marks |

30 | Advance Level Test - 14: Full Syllabus | Full Syllabus Test-2 | 65 | 100 | 180 min | 1/3 Marks | ||

31 | Advance Level Test - 15: Full Syllabus | Full Syllabus Test-3 | 65 | 100 | 180 min | 1/3 Marks | ||

32 | Advance Level Test - 16 : Full Syllabus | Full Syllabus Test-4 | 65 | 100 | 180 min | 1/3 Marks | ||

Candidate should upload their GATE 2018 admit card to access below mention tests | ||||||||

33 | After availability of GATE - 2018 Admit Card |
GATE Mock Test - 1 : Full Syllabus | GATE Mock Test 1 | 65 | 100 | 180 min | 1/3 Marks | |

34 | GATE Mock Test - 2 : Full Syllabus | GATE Mock Test 2 | 65 | 100 | 180 min | 1/3 Marks | ||

35 | GATE Mock Test - 3 : Full Syllabus | GATE Mock Test 3 | 65 | 100 | 180 min | 1/3 Marks | ||

36 | GATE Mock Test - 4 : Full Syllabus | GATE Mock Test 4 | 65 | 100 | 180 min | 1/3 Marks |

Tests | Test Activation Date | Test Closing Date | Practice Tests | Test Syllabus | No. of Ques. | Marks | Timing | Negative Marks |
---|---|---|---|---|---|---|---|---|

1 | 20- June - 2017 | 11 - Feb - 2018 | Networks-1 | Network solution methods: nodal and mesh analysis; Network theorems: Network solution methods: nodal and mesh analysis; Network theorems: superposition, Thevenin and Norton's, maximum power transfer; Wye‐Delta transformation; Steady state sinusoidal analysis using phasors; Frequency domain analysis of RLC circuits. |
16 | 25 | 45 min | 1/3 Marks |

2 | Networks-2 | Time domain analysis of simple linear circuits; Solution of network equations using Laplace transform; Linear 2‐port network parameters: driving point and transfer functions; State equations for networks. |
16 | 25 | 45 min | 1/3 Marks | ||

3 | Signals and Systems-1 | Continuous-time signals: Fourier series and Fourier transform representations, sampling theorem and applications; Continuous LTI systems: definition and properties, causality, stability, impulse response, convolution, poles and zeros, parallel and cascade structure, frequency response, group delay, phase delay. |
16 | 25 | 45 min | 1/3 Marks | ||

4 | Signals and Systems-2 | Discrete-time signals: discrete-time Fourier transform (DTFT), DFT, FFT, Z-transform, interpolation of discrete-time signals; Discrete LTI systems: definition and properties, causality, stability, impulse response, convolution, poles and zeros, parallel and cascade structure, digital filter design techniques. |
16 | 25 | 45 min | 1/3 Marks | ||

5 | Electronic Devices-1 | Energy bands in intrinsic and extrinsic silicon; Carrier transport: diffusion current, drift current, mobility and resistivity; Generation and recombination of carriers; Poisson and continuity equations; P-N junction, Zener diode. |
16 | 25 | 45 min | 1/3 Marks | ||

6 | Electronic Devices-2 | BJT, MOS capacitor, MOSFET, LED, photo diode and solar cell; Integrated circuit fabrication process: oxidation, diffusion, ion implantation, photolithography and twin-tub CMOS process. |
16 | 25 | 45 min | 1/3 Marks | ||

7 | Analog Circuits-1 | Small signal equivalent circuits of diodes, BJTs and MOSFETs; Simple diode circuits: clipping, clamping and rectifiers; Single-stage BJT and MOSFET amplifiers: biasing, bias stability, mid-frequency small signal analysis and frequency response; BJT and MOSFET amplifiers: multi-stage, differential. |
16 | 25 | 45 min | 1/3 Marks | ||

8 | Analog Circuits-2 | Feedback, power and operational amplifiers; Simple op-amp circuits; Active filters; Sinusoidal oscillators: criterion for oscillation, single-transistor and op-amp configurations; Function generators, wave-shaping circuits and 555 timers; Voltage reference circuits; Power supplies: ripple removal and regulation. |
16 | 25 | 45 min | 1/3 Marks | ||

9 | Digital Circuits-1 | Number systems; Combinatorial circuits: Boolean algebra, minimization of functions using Boolean identities and Karnaugh map, logic gates and their static CMOS implementations, arithmetic circuits, code converters, multiplexers, decoders and PLAs. |
16 | 25 | 45 min | 1/3 Marks | ||

10 | Digital Circuits-2 | Sequential circuits: latches and flip‐flops, counters, shift‐registers and finite state machines; Data converters: sample and hold circuits, ADCs and DACs. |
16 | 25 | 45 min | 1/3 Marks | ||

11 | Microprocessors -1 | Semiconductor memories: ROM, SRAM, DRAM; 8-bit microprocessor (8085): architecture, programming, memory and I/O interfacing. |
16 | 25 | 45 min | 1/3 Marks | ||

12 | Microprocessors -2 | Semiconductor memories: ROM, SRAM, DRAM; 8-bit microprocessor (8085): architecture, programming, memory and I/O interfacing. |
16 | 25 | 45 min | 1/3 Marks | ||

13 | 20- July - 2017 | 11 - Feb - 2018 | Control Systems-1 | Basic control system components; Feedback principle; Transfer function; Block diagram representation; Signal flow graph; Transient and steady-state analysis of LTI systems; Routh-Hurwitz. |
16 | 25 | 45 min | 1/3 Marks |

14 | Control Systems-2 | Root-locus plots; Frequency response, Nyquist stability criteria and Bode plot; Lag, lead and laglead compensation; State variable model and solution of state equation of LTI systems. |
16 | 25 | 45 min | 1/3 Marks | ||

15 | Electromagnetics-1 | Electrostatics; Maxwell's equations: differential and integral forms and their interpretation, boundary conditions, wave equation, Poynting vector; Plane waves and properties: reflection and refraction, polarization, phase and group velocity, propagation through various media, skin depth. |
16 | 25 | 45 min | 1/3 Marks | ||

16 | Electromagnetics-2 | Transmission lines: equations, characteristic impedance, impedance matching, impedance transformation, S-parameters, Smith chart; Waveguides: modes, boundary conditions, cut-off frequencies, dispersion relations; Antennas: antenna types, radiation pattern, gain and directivity, return loss, antenna arrays; Basics of radar; Light propagation in optical fibers. |
16 | 25 | 45 min | 1/3 Marks | ||

17 | Communications-1 | Analog communications: amplitude modulation and demodulation, angle modulation and demodulation, spectra of AM and FM, superheterodyne receivers, circuits for analog communications. |
16 | 25 | 45 min | 1/3 Marks | ||

18 | Communications-2 | Random processes: autocorrelation and power spectral density, properties of white noise, filtering of random signals through LTI systems. |
16 | 25 | 45 min | 1/3 Marks | ||

19 | Communications-3 | Information theory: entropy, mutual information and channel capacity theorem; Digital communications: PCM, DPCM; Inter-symbol interference and its mitigation. |
16 | 25 | 45 min | 1/3 Marks | ||

20 | Communications-4 | digital modulation schemes, amplitude, phase and frequency shift keying (ASK, PSK, FSK), QAM, MAP and ML decoding, matched filter receiver, calculation of bandwidth, SNR and BER for digital modulation; Fundamentals of error correction, Hamming codes; Timing and frequency synchronization, Basics of TDMA, FDMA and CDMA. |
16 | 25 | 45 min | 1/3 Marks | ||

21 | Engineering Mathematics-1 |
Linear Algebra, Calculus, Differential Equations. |
16 | 25 | 45 min | 1/3 Marks | ||

22 | Engineering Mathematics-2 |
Vector Analysis, Complex Analysis, Numerical Methods, Probability and Statistics. |
16 | 25 | 45 min | 1/3 Marks | ||

23 | General Aptitude-1 | Verbal Ability and Reasoning |
16 | 25 | 45 min | 1/3 Marks | ||

24 | General Aptitude-2 | Numerical Ability |
16 | 25 | 45 min | 1/3 Marks |