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Test Time Table -  EC

GATE 2017 Online Test Series : Electronics & Communication Engineering

Tests Test Activation Date Test Closing Date Test Type Test Syllabus No. of Ques. Marks Timing Negative Marks
1 1- Aug - 2016 12 - Feb - 2017 Basic Level Test - 1 : Part Syllabus Networks 33 50 90 min 1/3 Marks
2 Basic Level Test - 2 : Part Syllabus Control Systems 33 50 90 min 1/3 Marks
3 Basic Level Test - 3 : Part Syllabus Electronic Devices 33 50 90 min 1/3 Marks
4 Basic Level Test - 4 : Part Syllabus Engineering Mathematics 33 50 90 min 1/3 Marks
5 16- Aug - 2016 12 - Feb - 2017 Basic Level Test - 5 : Part Syllabus Electromagnetics 33 50 90 min 1/3 Marks
6 Basic Level Test - 6 : Part Syllabus General Aptitude 33 50 90 min 1/3 Marks
7 Basic Level Test - 7 : Part Syllabus Signals & Systems 33 50 90 min 1/3 Marks
8 Basic Level Test - 8 : Part Syllabus Analog Communication Systems 33 50 90 min 1/3 Marks
9 1- Sep - 2016 12 - Feb - 2017 Basic Level Test - 9 : Part Syllabus Digital Communication Systems 33 50 90 min 1/3 Marks
10 Basic Level Test - 10 : Part Syllabus Digital Electronics 33 50 90 min 1/3 Marks
11 Basic Level Test - 11: Part Syllabus Analog Electronics 33 50 90 min 1/3 Marks
12 Basic Level Test - 12: Part Syllabus Microprocessors 33 50 90 min 1/3 Marks
13 16- Sep - 2016 12 - Feb - 2017 Basic Level Test - 13: Full Syllabus Full Syllabus Test-1 65 100 180 min 1/3 Marks
14 Basic Level Test - 14: Full Syllabus Full Syllabus Test-2 65 100 180 min 1/3 Marks
15 Basic Level Test - 15: Full Syllabus Full Syllabus Test-3 65 100 180 min 1/3 Marks
16 Basic Level Test - 16: Full Syllabus Full Syllabus Test-4 65 100 180 min 1/3 Marks
17 1- Oct - 2016 12 - Feb - 2017 Advance Level Test - 1 : Part Syllabus Networks 33 50 90 min 1/3 Marks
18 Advance Level Test - 2 : Part Syllabus Control Systems 33 50 90 min 1/3 Marks
19 Advance Level Test - 3 : Part Syllabus Electronic Devices 33 50 90 min 1/3 Marks
20 Advance Level Test - 4 : Part Syllabus Engineering Mathematics 33 50 90 min 1/3 Marks
21 16- Oct - 2016 12 - Feb - 2017 Advance Level Test - 5 : Part Syllabus Electromagnetics 33 50 90 min 1/3 Marks
22 Advance Level Test - 6 : Part Syllabus General Aptitude 33 50 90 min 1/3 Marks
23 Advance Level Test - 7 : Part Syllabus Signals & Systems 33 50 90 min 1/3 Marks
24 Advance Level Test - 8 : Part Syllabus Analog Communication Systems 33 50 90 min 1/3 Marks
25 1- Nov - 2016 12 - Feb - 2017 Advance Level Test - 9 : Part Syllabus Digital Communication Systems 33 50 90 min 1/3 Marks
26 Advance Level Test - 10 : Part Syllabus Digital Electronics 33 50 90 min 1/3 Marks
27 Advance Level Test - 11: Part Syllabus Analog Electronics 33 50 90 min 1/3 Marks
28 Advance Level Test - 12: Part Syllabus Microprocessors 33 50 90 min 1/3 Marks
29 16- Nov - 2016 12 - Feb - 2017 Advance Level Test - 13: Full Syllabus Full Syllabus Test-1 65 100 180 min 1/3 Marks
30 Advance Level Test - 14: Full Syllabus Full Syllabus Test-2 65 100 180 min 1/3 Marks
31 Advance Level Test - 15: Full Syllabus Full Syllabus Test-3 65 100 180 min 1/3 Marks
32 Advance Level Test - 16 : Full Syllabus Full Syllabus Test-4 65 100 180 min 1/3 Marks
Candidate should upload their GATE 2017 admit card to access below mention tests
33 After
availability
of GATE - 2017
Admit Card
GATE Mock Test - 1 : Full Syllabus GATE Mock Test 1 65 100 180 min 1/3 Marks
34 GATE Mock Test - 2 : Full Syllabus GATE Mock Test 2 65 100 180 min 1/3 Marks
35 GATE Mock Test - 3 : Full Syllabus GATE Mock Test 3 65 100 180 min 1/3 Marks
36 GATE Mock Test - 4 : Full Syllabus GATE Mock Test 4 65 100 180 min 1/3 Marks


Practice Test Series (30 Tests)

Tests Test Activation Date Test Closing Date Test Type Test Syllabus No. of Ques. Marks Timing Negative Marks
1 20- Aug - 2016 12 - Feb - 2017 Practice Test-1 Network Theory- Part 1

Network solution methods: nodal and mesh analysis; Network theorems: superposition, Thevenin and Norton’s, maximum power transfer; Wye-Delta transformation.

16 25 45 min 1/3 Marks
2 Practice Test-2

Network Theory- Part 2

Steady state sinusoidal analysis using phasors.

16 25 45 min 1/3 Marks
3 Practice Test-3 Network Theory- Part 3

Time domain analysis of simple linear circuits; Solution of network equations using Laplace transform; Frequency domain analysis of RLC circuits.

16 25 45 min 1/3 Marks
4 Practice Test-4 Network Theory- Part 4

Linear 2-port network parameters: driving point and transfer functions; State equations for networks.

16 25 45 min 1/3 Marks
5 Practice Test-5 Signals & Systems- Part 1

LTI systems: definition and properties, causality, stability, impulse response, convolution, poles and zeros, parallel and cascade structure, frequency response, group delay, phase delay.

16 25 45 min 1/3 Marks
6 Practice Test-6 Signals & Systems- Part 2

Sampling theorem and applications; Continuous-time signals: Fourier series and Fourier transform representations.

16 25 45 min 1/3 Marks
7 Practice Test-7 Signals & Systems- Part 3

Discrete-time signals: discrete-time Fourier transform (DTFT), DFT, FFT. Ztransform, interpolation of discrete-time signals. Digital filter design techniques.

16 25 45 min 1/3 Marks
8 Practice Test-8 Electronic Devices - Part 1

Energy bands in intrinsic and extrinsic silicon; Carrier transport: diffusion current, drift current, mobility and resistivity; Generation and recombination of carriers; Poisson and continuity equations; P-N junction, Zener diode. LED, photo diode and solar cell.

16 25 45 min 1/3 Marks
9 Practice Test-9 Electronic Devices- Part 2

BJT, MOS capacitor, MOSFET. Integrated circuit fabrication process: oxidation, diffusion, ion implantation, photolithography and twin-tub CMOS process.

16 25 45 min 1/3 Marks
10 Practice Test-10 Analog Circuits - Part 1

Simple diode circuits: clipping, clamping and rectifiers. Voltage reference circuits; Power supplies: ripple removal and regulation. Wave-shaping circuits. Small signal equivalent circuits of diodes.

16 25 45 min 1/3 Marks
11 15- Sep - 2016 12 - Feb - 2017 Practice Test-11 Analog Circuits - Part 2

BJT biasing, bias stability; Small signal equivalent circuits of BJTs. Single-stage BJT amplifiers, Mid-frequency small signal analysis and frequency response.

16 25 45 min 1/3 Marks
12 Practice Test-12 Analog Circuits - Part 3

FET biasing; Small signal equivalent circuits of FET. Single-stage FET amplifiers. Amplifiers: multi-stage, feedback, power.

16 25 45 min 1/3 Marks
13 Practice Test-13 Analog Circuits - Part 4

Operational amplifier; Simple op-amp circuits; Active filters; Sinusoidal oscillators: criterion for oscillation, single-transistor and op-amp configurations; Function generators, 555 timers, differential amplifier.

16 25 45 min 1/3 Marks
14 Practice Test-14 Digital Circuits- Part 1

Number systems; Combinatorial circuits: Boolean algebra, minimization of functions using Boolean identities and Karnaugh map, logic gates and their static CMOS implementations, arithmetic circuits, code converters, multiplexers, decoders and PLAs.

16 25 45 min 1/3 Marks
15 Practice Test-15 Digital Circuits- Part 2

Sequential circuits: latches and flip-flops, counters, shift-registers and finite state machines; Data converters: sample and hold circuits, ADCs and DACs; Semiconductor memories: ROM, SRAM, DRAM.

16 25 45 min 1/3 Marks
16 Practice Test-16 Microprocessor

8-bit microprocessor (8085): architecture, programming, memory and I/O interfacing.

16 25 45 min 1/3 Marks
17 Practice Test-17 Control Systems - Part 1

Basic control system components; Feedback principle; Transfer function; Block diagram representation; Signal flow graph.

16 25 45 min 1/3 Marks
18 Practice Test-18 Control Systems - Part 2

Transient and steady-state analysis of LTI systems. Routh-Hurwitz. Root-locus plots.

16 25 45 min 1/3 Marks
19 Practice Test-19 Control Systems - Part 3

Lag, lead and lag-lead compensation; Frequency response; Nyquist stability criteria; Bode plot. State variable model and solution of state equation of LTI systems.

16 25 45 min 1/3 Marks
20 Practice Test-20 Communications - Part 1

Random processes: autocorrelation and power spectral density, properties of white noise, filtering of random signals through LTI systems.

16 25 45 min 1/3 Marks
21 10- Oct - 2016 12 - Feb - 2017 Practice Test-21 Communications - Part 2

Analog communications: amplitude modulation and demodulation, angle modulation and demodulation, spectra of AM and FM, superheterodyne receivers, circuits for analog communications.

16 25 45 min 1/3 Marks
22 Practice Test-22 Communications - Part 3

Information theory: entropy, mutual information and channel capacity theorem. Fundamentals of error correction, Hamming codes; Timing and frequency synchronization, inter-symbol interference and its mitigation; Basics of TDMA, FDMA and CDMA.

16 25 45 min 1/3 Marks
23 Practice Test-23 Communications - Part 4

Digital communications: PCM, DPCM, digital modulation schemes, amplitude, phase and frequency shift keying (ASK, PSK, FSK), QAM, MAP and ML decoding, matched filter receiver, calculation of bandwidth, SNR and BER for digital modulation.

16 25 45 min 1/3 Marks
24 Practice Test-24 Electromagnetics- Part 1

Electrostatics; Maxwell’s equations: differential and integral forms and their interpretation, boundary conditions. Wave equation, Poynting vector.

16 25 45 min 1/3 Marks
25 Practice Test-25 Electromagnetics- Part 2

Plane waves and properties: reflection and refraction, polarization, phase and group velocity, propagation through various media, skin depth. Transmission lines: equations, characteristic impedance, impedance matching, impedance transformation, S-parameters, Smith chart.

16 25 45 min 1/3 Marks
26 Practice Test-26 Electromagnetics- Part 3

Waveguides: modes, boundary conditions, cut-off frequencies, dispersion relations; Antennas: antenna types, radiation pattern, gain and directivity, return loss, antenna arrays; Basics of radar; Light propagation in optical fibers.

16 25 45 min 1/3 Marks
27 Practice Test-27 Engineering Mathematics- Part 1

Calculus, Differential Equations

16 25 45 min 1/3 Marks
28 Practice Test-28 Engineering Mathematics- Part 2

Vector Analysis, Linear Algebra, Complex Analysis Numerical Methods , Probability and Statistics

16 25 45 min 1/3 Marks
29 Practice Test-29 General Aptitude- Part I 16 25 45 min 1/3 Marks
30 Practice Test-30 General Aptitude- Part 2 16 25 45 min 1/3 Marks
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